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An interesting technology repair horizontal scan TV

As is often the question of Troubleshooting TDKS with inadequate behavior of the circuit (do not want to turn on the TV, out of order line transistor linearity violation scan, etc.) and how much energy and money is wasted. It will be shown how to use simple equipment can be carried out dynamic tests TDKS, OS, TPI and others. TV units.

The output stages sweep closely with BP and protection circuits, and a master oscillator and the penultimate stage. Often the cause of the defect is determined OS, is not it. TDKS change and continue to look for the defect when the output stage is working fine. This helps to quickly identify the dynamic test.

The test principle is built on the work of emulation line scan. In the output stage supply voltage is fed in about ten of smaller nominal (+12). For the emitter and the collector of the output transistor are connected, respectively, the source and drain of the FET (BUZ90). At the gate of the transistor serves 5-10V pulses with amplitude 15,625Gts frequency (or twice as much for 100Hz TVs) and the duration of the active phase of 26 ms and 38 ms passive. In the OS and TDKS produced current and voltage amplitude of less than about ten of the working of the amplitude.

Practice shows that such tests do not interfere with conduct at the beginning of the repair, to waste no time to test trial versions of defects. For this it is convenient to assemble simple device - load Testori. The basis of the scheme of the generator with adjustable duty cycle and CMOS switch. Approximately scheme might be:

Three terminals (col, B +, gnd)

With the help of this tester is determined by the average current consumed by the horizontal sweep, and with the help of oscilloscope controls the shape and duration of the IOC. Current consumption from 20 to 50 mA, duration of IOC 12-15mks and smooth (without the "rough"), a form of talk about the output stage circuit and deflection serviceability. The slightest change in the regulations of the scanning lead to changes in the above parameters.

Self-other to the device it is necessary to get used to. Then it can be applied more broadly. For example the author uses the device for determining the pinout of the unknown (or no data) TDKS and TPI. In adapting contingency ( "left") to replace the original TDKS dynamic tester just a gift. It can be used not only to measure seven times before the first use, but also to quickly determine how to most successfully skaskadirovat winding.

If you connect the tester to the chassis, ensure the integrity of the line transistor and rectifier B +.

If everything is fine, and the unfolding "ship" tester should be connected to the tester and re-shot TDKS produce metering (defective consumes about 10mA)

At first use of the device can puncture in the diagnosis .For example, if the inter-sample, then removed TDKS current normalized. In this case, the tester alternately common wire connected alternately to all the windings. Anode rectifier removed TDKS Test Connection Capacity 2200 pF on 3-5kV between the suction cup and the terminal ABL. (If TDKS in the scheme do not need)

Thus it is possible not only to determine the serviceability, but also the nature of the defect.

Any high-Q coil can be verified by submitting it to a short pulse and then tracked fading formed coil circuit and it is their own capacity. Rapid decay talking about closing the loop.

If you provide such a regime in the tester, its functionality is enhanced.

The above methods, you can check any pulse converter (BP, pulse regulators and controllers). And be smart, you can even check in individual cases kinescope. As you become accustomed to the unit expands its application.

In conclusion, it should be noted that the principle of the tester is used in the Spanish appliance firm HR. Only Spaniards detector regularly serves as the voltage on the suction cup and testing device are previous TDKS.

In preparing the themes used edition of "digital TV REPAIR" PF Gavrilov, AJ Santa Moscow "Radioton" in 1999, as well as personal experience.

Publication date 02.03.2004g.

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